With Design-For-Test (DFT), test coverage is the typical yardstick used to gauge the quality of the manufacturing tests being performed. But as next-generation designs become more complex, traditional ...
Over the last decade, there has been a move away from powered-up digital in-circuit vector testing to unpowered analog-based (vectorless) device-pin opens testing for large and sometimes small digital ...
It is becoming clear that functional testing of integrated circuits, the most widely used and oldest method in the semiconductor industry has reached the limits of its effectiveness. Functional Test ...
The very process of testing digital circuits routinely increases their dynamic power consumption to levels far exceeding their power specification. If the power consumption is great enough, it can ...
When it comes to compliance test, USB 3.0 has more in common with PCI Express and Serial ATA than with USB 2.0. Tektronix's Chris Loberg takes you through what you'll need to know to gain USB 3.0 ...
In today's fast-paced world of software development, automation has become a cornerstone of testing, ensuring quality and efficiency amidst increasingly complex applications. With faster release ...
The amount of electronic content in passenger cars is growing rapidly, primarily due to the integration of advanced safety features. The shift towards fully autonomous vehicles, which must comply with ...
A test plan is basically the roadmap for your testing efforts. It’s a document that lays out what you’re going to test, how ...
Semiconductor design, manufacturing, and test are becoming much more tightly integrated as the chip industry seeks to optimize designs using fewer engineers, setting the stage for greater efficiencies ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback