KUMAMOTO, Japan--(BUSINESS WIRE)--Dec. 2, 2004--Teradyne, Inc. (NYSE:TER) announced the Semiconductor Test Japan Division has started shipment of the IP750EP, a new extended performance CCD/CMOS image ...
Before running a formal test with multiple resistance temperature detector (RTD) sensors, it is often necessary to calibrate and debug a data-acquisition system to verify basic functionality. The ...
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