Abstract: Wafer probing test is crucial for selecting the known good dies via the probe card as the testing signal interface between the tester and the integrated circuits on the fabricated wafers.

The build-up to India’s Test series against South Africa kicked off in Kolkata as players have started arriving in the city. Captain Shubman Gill, Jasprit Bumrah, and all-rounders Nitish Kumar Reddy ...

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