Abstract: Memory window (MW) closure, read delay, and gate leakage are three key reliability challenges in ferroelectric (FE) field-effect transistors (FEFETs), all of which have traditionally been ...
Abstract: Learning and memory have long been a focal point of research across neuroscience and artificial intelligence. A deep understanding of the neural mechanisms underlying learning and memory is ...
CENTRAL NEW YORK (WSYR-TV) — A colder-than-normal November in Central New York might mean some people are turning up their heat earlier than they were last year. But as the federal government waits to ...
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